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Multi-Wall Nanotube on Silicon Dioxide

Caption:

A bent multi-wall nanotube on silicon dioxide. The tube is draped across a gold electrode (see insert), and was scanned using conductance imaging AFM, a method that combines force microscopy and contact resistance measurements. The colors represent conductance data and the height gives topographical data. As the tube bends it forms buckles. The buckles have a different contact area to the tip than the rest of the tube and thus show up very nicely in the conductance data.

The National Science Foundation funded the nanomanipulator tool used to create this image.

Multi-Wall Nanotube on Silicon Dioxide
(Preview Only)

Credit: Credit Michael Stadermann, with thanks to the nano manipulator group at UNC-Chapel Hill, funded by NSF, NIH, and DOD.
Year of Image: 2002

Categories:

NANOTECHNOLOGY

Formats Available:

TIFF Format - 5.09M - 1134 x 1568 pixel image - 72 DPI

Sorry! This image is not available in a higher resolution format.

Restrictions:

Permission is granted to use this image for personal, educational, or nonprofit/non-commercial purposes only. Permission to use this image in a manner not stated here must be obtained from the owner, Michael Stadermann at staderma@email.unc.edu.

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Last Modified: Mar 29, 2001