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Image: A bent multi-wall nanotube on silicon dioxide. The tube is draped across a gold electrode (see insert), and was scanned using conductance imaging AFM, a method that combines force microscopy and contact resistance measurements. The colors represent conductance data and the height gives topographical data. As the tube bends it forms buckles. The buckles have a different contact area to the tip than the rest of the tube and thus show up very nicely in the conductance data.<BR> <BR> The National Science Foundation funded the nanomanipulator tool used to create this image. Thumbnail

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Last Modified: Jan 31, 2001