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Measurement Expertise

Electron Beam Microanlaysis Methods (SEM, EPMA, AEM, Auger, ESEM, WDS, EDS, EELS)Microbeam Mass Spec (SIMS, TOF-SIMS, LMMS, Cluster SIMS)Optical Microscopies and Spectroscopies (NSOM, MicroRaman, MicroIR, Nonlinerar Optics)Particles and Powders (Standards, PM2.5, Size, Composition, Image AnalysisThin Films and Coatings (Semiconductor, Thermal Barrier, Optical, etc.)Scanned Probe Techniques (AFM, Near-field Raman,IR,Microwave)X-Ray Beam Methods (XPS, MicroXRD, MicroXRF) Isotopic Methods (SIMS, TOF-SIMS, AMS, IRMS)

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Chemical Characterization of MaterialsEnvironmental MeasurementsInternational StandardsMicroelectronicsNanotechnology

 

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Combinatorial Methods Roadmap Available

 Schematic of Combinatorial Array

Download the Combinatorial Methods Roadmap 2001 in PDF format. Requires Adobe Acrobat Reader.

Future Meetings

NIST-MAS-AVS-MAMAS Workshop
Modeling Electron Transport
November 8-10, 2004

NIST-MAS Workshop on Particle Analysis
Coming April, 2005

Past Meetings

Spectrum Imaging and Multispectral/hyperspectral Data Analysis, April 28-May 1, 2003

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Last updated: October 15, 2004