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Optoelectronics Division (815.00)
National Institute of Standards and Technology
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August 2004

EEEL Holds Annual Laser Measurement Short Course

The 19th annual Laser Measurement Short Course, sponsored by EEEL's Optoelectronics Division, was held at NIST on August 3 through 6. The three-and-one-half-day course emphasized the concepts, techniques, and apparatus used in measuring laser parameters and included a visit to the NIST laser measurement laboratories.

For more information on this work, click here.


July 2004

EEEL Develops Novel Carbon Nanotube Coating for Next Generation Optical Standards

EEEL researcher John Lehman, along with collaborators Anne Dillon and Chaiwat Engtrakul from the National Renewable Energy Laboratory, have evaluated a bulk form of single-wall carbon nanotubes (SWNTs) as a coating for future optical standards.

For more information on this work, click here.


May 2004

EEEL Demonstrates Photon Antibunching at High Temperature from Single Quantum Dot

Rich Mirin of the EEEL Optoelectronics Division has demonstrated photon antibunching from a single, self-assembled InGaAs quantum dot at temperatures from 5 K up to 135 K, and single photon emission up to 120 K. Emitters of single photons on demand are important for low light level metrology and quantum key distribution, or quantum cryptography.

For more information on this work, click here.