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ATP Project Brief


2004 General Competition (September 2004)

High-Speed AFM-Based Platform for Quantitative Nanomechanical Measurements

Microelectromechanical Technology


Develop an atomic force microscopy based platform for high-speed, high-bandwidth quantitative nanomechanical measurements which provides structure-property understanding at the nanoscale in order to accelerate discovery, design, and commercialization of nanomaterials.

Sponsor: The Dow Chemical Company

External Technology
1776 Building
Midland, MI 48674

 

  • Project duration: 10/1/2004 - 9/30/2007
  • Total project (est.): $13,389,209
  • Requested ATP funds: $6,560,714

 

Materials on the nanoscale - those with structures measured in nanometers (<100 nm) - offer revolutionary capabilities and performance based on the unique advantages of ultra-small structure. The promise of such nanomaterials cannot be fully realized, however, until the relationships between structure and physical properties are understood at nanometer level. Currently no instrumentation exists for measuring quantitative material properties at this scale for a wide variety of material types. This is recognized as a key bottleneck to retaining U.S. research leadership in nanotechnology versus foreign competition. The Dow Chemical Company (Midland, Mich.) and Veeco Instruments, Inc. (Woodbury, N.Y.) propose to develop and validate the world's first platform for high-speed, high-bandwidth quantitative nanomechanical measurements (QNM). The proposed QNM will greatly accelerate materials discovery and development by providing the tools and data to engineer materials tailored to handle specific stresses for specific applications - materials by design. The main instrument will be based on atomic force microscopy (AFM), a well-established technique for high-resolution surface imaging and compositional imaging, combined with nanoindentation to determine mechanical properties. The project will take on several difficult technical barriers, including AFM's slow scanning speed and inability to provide quantitative mechanical data, and the poor nanoscale resolution of existing indentation measurements. Technical goals include 100-fold improvements in imaging speed and dynamic bandwidth for AFM, and the ability to make quantitative nanoscale measurements of elastic modulus (within 5 percent) for dimensions under 100 nm. If successful, the QNM platform will lead to a wide range of technical and economic benefits, but this project will focus on two that are particularly compelling: polypropylene nanocomposites (which can save fuel costs by lowering the overall weight of automobiles) and reduction of yield loss in below-65 nm semiconductor manufacturing (both applications offer savings of hundreds of millions of dollars per year). The ATP funding will substantially accelerate commercialization of this high-risk platform technology by at least three years and enable the US to maintain its technological lead in this arena.

 

Active Project Participants
  • Veeco Instruments, Inc. (Santa Barbara, Calif.)
For project information:
Jeff Schatzer, (989) 636-5017
jlschatzer@dow.com

ATP Project Manager
Michael McDermott, 301-975-5475
mikemcd@nist.gov

 

This is the fact sheet for this project as it was announced on September 28, 2004.
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Date created: 9/28/2004
Last updated: 9/28/2004
Contact: inquiries@nist.gov