NASA/LaRC has a requirement for an inverted light optical microscope system is needed to serve several metallographic purposes. The inverted microscope system is needed to collect and process brightfield and darkfield images of representative microstructures of aeronautical and aerospace metallics and organics. Microstructures of light metallics such as aluminum base and titanium base alloys as well as high temperature metallics such as nickel base superalloys shall be suitably captured with minimal instrumental artifacts. Microstructural details in coated reinforced carbon-carbons and molybdenum-rhenium heatpipes shall be faithfully recorded. Corrosion products and crack initiation sites in aging aircraft airframe components shall be suitably photomicrographed. Metallographic images of, for example, surface thin films of anodized aluminum alloys are required to be accurately collected and processed in the polarization modes of circularly polarized light and circular differential interference contrast. A rotating specimen stage, if available, would enable easier acquisition of regular differential interference contrast images and would be a desirable accessory in the inverted microscope system.
The inverted light optical microscope system shall include an image capture capability. The image capture capability shall include all relevant hardware and software, such as a digital camera and camera adapter, image acquisition board, image analysis software and a computer system, which can process a library of high resolution images. The image capture capability shall include a simple utility for acquiring microscope magnification data from an included encoder in order to record an accurate micron bar on user-designated photomicrographs.
The inverted light optical microscope system shall include stage micrometers, accessory lenses and all ancillary devices needed to satisfy system requirements.
All components shall be new. A vendor’s response shall be specific and detailed enough to allow evaluation of the proposed inverted light microscope system. A vendor shall include relevant descriptive literature with the proposal. A set of comprehensive user’s manuals shall be provided. All components shall be covered by a comprehensive warranty. Training (to include accessories) for users of the inverted light microscope system shall be provided at the end user’s site.
This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation, which is issued as a Request for Quotation (RFQ); quotes are being requested and a written solicitation will not be issued. Offerors are required to use the On-Line RFQ system to submit their quote. The On-line RFQ system is linked above or it may be accessed at http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=C&pin;= . The information required by FAR Subpart 12.6 is included in the on-line RFQ.
The Government intends to acquire a commercial item using FAR Part 12 and the Simplified Acquisition Procedures set forth in FAR Part 13.
Questions regarding this acquisition must be submitted in writing (e-mail is preferred) no later than September 3, 2004. It is the quoter's responsibility to monitor this site for the release of amendments (if any). Potential quoters will be responsible for downloading their own copy of this notice, the on-line RFQ and amendments (if any).
An ombudsman has been appointed - See NASA Specific Note "B".
Any referenced notes may be viewed at the following URLs link below.
