The Microbeam Analysis Society and the NIST Microanalysis Research Group will co-sponsor an MAS Special Topics Workshop a 4-day workshop on spectrum imaging and multispectral/hyperspectral data analysis. The workshop will cover forms of hyperspectral data relevant to microbeam analysis, including STEM-based EELS and XEDS, energy-filtered TEM imaging, XEDS in the SEM, spectrum imaging in SIMS, and (to a lesser extent) optical spectroscopies such as microIR and microRaman. Issues related to data acquisition and instrumentation will be covered in addition to multivariate statistical analysis, chemometrics, and other hyperspectral data processing topics. Along with traditional sessions featuring invited and contributed talks, the limited attendance workshop will include interactive sessions such as roundtable discussions, problem solving groups, tutorials, and laboratory demos/tours. Experts on hyperspectral analysis from the remote sensing and signal processing communities will give tutorials explaining some of the advanced techniques developed in those fields over the past 30 years and how they might apply to the problems facing microbeam analysis. One of the goals of the workshop is to reach a consensus about the current state of hyperspectral techniques in microbeam analysis, identify significant needs and opportunities for progress, and produce a roadmap to guide future work.
We are now preparing a list of invited
speakers, and we are actively soliciting volunteers who would like to present
a talk or lead a discussion group. Please feel free to suggest yourself or others
as possible speakers or suggest additional topics or activities you would like
to see included in the workshop. In addition, if you are simply interested in
attending the meeting, please send your name, address, telephone number, email,
and FAX to one of the meeting organizers listed above.
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Last Updated
March 18, 2003
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Web Contact micro@nist.gov