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International Measurement Standards

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About Our Research

The goal of this program is for NIST to maintain a leadership role in standard methods (ISO) and reference data and materials with National Metrology Institutes from other countries for Surface and Microanalysis. Information on international standards is relayed to our relevent US industry partners to make sure that ISO methods and guides are in the best interest of US industry.

Technical Contact: Dave Simons

Our role can be grouped into three areas:

 

IAEA (International Atomic Energy Agency)

 

 

 

CCQM

  • Measurement of thickness of nanoscale silicon oxide films
  • Ambient CO2 in Air – (isotopics)

 

ISO Committees

Division staff serve in leadership roles and as experts on ISO Technical Committees TC 201 on Surface Chemical Analysis and TC 202 on Microbeam Analysis.

Current standards that are being prepared include:

  • Standard for X-ray Spectral Interchange Files
  • Standard Method for Determining Relative Sensitivity Factors from Ion-Implanted Reference Materials
  • Standard Method for Testing Microheterogeneity for Electron Microprobe Standards
  • Standard Method for Magnification Calibration in the SEM
  • Standard Method for Electron Energy Loss Spectrometry for AEM
Last Updated March 5, 2002

Web Contact micro@nist.gov