| Crystallography/Diffraction |
| Macromolecular crystallography, including multi-wavelength anomalous dispersion (MAD) | X4A X4C X6A X8C X9A X12B X12C X25 X26C X29A |
| X-ray diffraction (XRD), powder | X3B1 X6B X7A X10A X10B X16B X17B1 X17B2 X17C X18A X23A2 X23B |
| X-ray diffraction (XRD), single-crystal | X6B X7B X14A X17C X18A X20A X20B X20C X22A X22C |
| X-ray scattering or diffraction (XRD), surface | X10B X16B X18A X19C X20A X20B X20C X22A X22B X22C |
| X-ray diffraction (XRD), time-resolved | X7B X10A X20C X22A X27C |
| X-ray scattering or diffraction, wide-angle (WAXS or WAXD) | X7B X10A X10B X18A X22A X27C |
| X-ray standing waves (XSW) | X15A X24A |
| Scattering |
|
| X-ray scattering, resonant | U4B X1B X13A |
| X-ray scattering, coherent | X1B |
| X-ray scattering, liquid | X19C X22B |
| X-ray scattering, magnetic | U4B X22C |
| Small angle x-ray scattering (SAXS) | X10A X21A1 X27C |
| X-ray reflectivity | X10A X10B X18A X19C X20A X20B X20C X22A X22C |
| Laser backscattering | X5A |
| Spectroscopy |
|
| X-ray absorption spectroscopy (XAS, XAFS) | U1A U12A X1B X3B1 X9B X10C X11A X11B X15B X16C X18B X19A X23A2 X23B |
| X-ray absorption spectroscopy, extended fine structure (EXAFS) | X3B1 X9B X10C X11A X11B X15B X18B X19A X23A2 X23B X24A |
| X-ray absorption spectroscopy, near edge x-ray absorption (NEXAFS, XANES) | U1A U7A U8B X9B X10C X11A X11B X15B X18B X19A X23A2 X23B |
| X-ray florescence spectroscopy | U4B X21A1 X24A |
| X-ray photoelectron spectroscopy (XPS) | U3C U4B U7A U16B X24A X24C |
| X-ray diffraction anomalous fine structure (DAFS) | X23A2 |
| X-ray inelastic scattering | X21A1 |
| Auger spectroscopy | X24A |
| UV florescence spectroscopy | U9B X1B |
| UV photoabsorption spectroscopy | U11 |
| UV photoionization spectroscopy | U11 |
| UV photoelectron spectroscopy (UPS) | U4A U4B U5UA U11 U13UB |
| UV photoelectron spectroscopy, angle-resolved (ARPES) | U5UA U8B U13UB X1B |
| UV photoelectron spectroscopy, spin- and angle resolved (SPARPES) | U5UA |
| Infrared vibrational spectroscopy | U2A U2B U4IR |
| Infrared transmission and reflection spectroscopy | U10A U12IR |
| THz / Millimeter wave spectroscopy | U12IR |
| Time-resolved spectroscopy | U12IR |
| Magnetospectroscopy | U5UA X13A |
| Imaging and Micro-Spectroscopy |
|
| Diffraction-enhanced imaging (DEI) | X15A |
| Infrared microspectroscopy (IRMS) | U2A U2B U4IR U10B |
| X-ray microprobe | X26A |
| Microdiffraction imaging | X13B X20A X26A |
| Scanning transmission x-ray microscopy (STXM) | X1A1 X1A2 |
| X-ray microtomography | X2B X27A |
| X-ray topography | X19C |
| Nanoscience Characterization |
|
| X-Ray Microprobe | X13B X26A |
| Microdiffraction imaging | X26A |
| Scanning transmission x-ray microscopy (STXM) | X1A1 X1A2 |
| Small angle x-ray scattering (SAXS) | X10A X21A1 X27C |
| X-ray scattering, liquid | X19C |
| Infrared microspectroscopy (IRMS) | U2B U10B |
| X-ray standing waves (XSW) | X15A |
| X-ray scattering, magnetic | U4B |
| X-ray magnetic circular dichroism (XMCD) | U4B |
| X-ray absorption spectroscopy, near edge x-ray absorption (NEXAFS, XANES) | U7A |
| X-ray reflectivity | X18A X22A |
| X-ray scattering or diffraction (XRD), surface | X18A X22A |
| X-ray diffraction (XRD), powder | X3B1 X7A |
| X-ray photoemission spectroscopy | U8B |
| X-ray absorption spectroscopy (XAS, XAFS) | X18B X19A X23A2 |
| Infrared transmission and reflection spectroscopy | U10A U12IR |
| Other |
|
| X-ray magnetic circular dichroism (XMCD) | U4B X13A |
| Ultraviolet circular dichroism (UV-CD) | U9B |
| High aspect ratio microsystems technology (HARMST) | |
| X-ray lithography | |
| Photon-stimulated desorption | U9A |
| Metrology | X8A |
| X-ray footprinting | X28C |
| High Pressure Research | U2A X17B2 X17B3 X17C |
| Focused white beam | |
