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NIST Standard Reference Database 71

NIST Electron Inelastic-Mean-Free-Path Database: Version 1.1

Link to the FAX or Mail Order Form

This database provides values of electron inelastic mean free paths (IMFPs) for use in quantitative surface analyses by AES and XPS. The database can provide IMFP information from up to three types of sources: calculated IMFPs from experimental optical data for a limited number of materials, IMFPs measured by elastic-peak electron spectroscopy for some elemental solids, and IMFPs from predictive formulae for all materials. The calculated and measured IMFPs were generally reported in journal papers at specified electron energies and these IMFPs were fit with appropriate functions so that IMFPs could be found by interpolation at intermediate energies.

Users may display/obtain IMFP values for elements, inorganic compounds, and organic compounds from the main menu. For a selected material in each class, the user can select a source of IMFPs (calculations, measurements, or predictive formulae) and then choose from a number of options for the energy range, IMFP units (manometers, Angstroms, and milligrams per square meter) and the type of display (linear, logarithmic, or linear/logarithmic coordinates).

Results may be displayed graphically; users can obtain an IMFP for a single electron energy, for multiple energies and can create an IMFP Table for regularly spaced electron energies. The IMFPs from the latter two options can be stored in files for later processing.

Please browse the Users' Guide to see how this database works.

Systems Requirements: IBM 486 or compatible operating on Windows, 95, 98,2000 or Windows 4.0 NT; hard disc space of 720 kilobytes minimum.

Cost: No charge.

Link to the FAX or Mail Order Form

For more information please contact:

Standard Reference Data Program
National Institute of Standards and Technology
100 Bureau Dr., Stop 2310
Gaithersburg, MD 20899-2310

(301) 975-2008 (VOICE) / (301) 926-0416 (FAX)
Contact Us (E-MAIL)

The scientific contact for the database is: Cedric Powell
National Institute of Standard and Technology
Surface and Microanalysis Science Division (837)
phone: (301) 975-2534
email: cedric.powell@nist.gov

Keywords: Auger-electron spectroscopy, electron inelastic mean free path, inelastic electron scattering, inelastic mean free path, surface analysis, x-ray photoelectron spectroscopy.

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Create Date: 6/02
Last Update: Thursday, 06-Mar-03 15:41:33
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