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Plastics

ATP Partner Thinks Big by Going Small with Nanotech Materials

Nanotechnology is delivering on its promise of improved performance in products ranging from dental adhesives to flame-retardant components for military ships. This is possible through the use of novel nanotechnology materials that can be manufactured affordably, thanks to support from the National Institute of Standards and Technology (NIST) Advanced Technology Program (ATP).

Polyhedral Oligomeric SilSesquioxanes (POSS®), made by Hybrid Plastics Inc. (Fountain Valley, Calif.), enable the design of additives that make plastics that are unusually lightweight, durable, heat tolerant and environmentally friendly. POSS® combines organic and inorganic materials in molecules with an average diameter of 1.5 nanometers (about 60 billionths of an inch. They can be used as either additives in or replacements for traditional plastics.

First developed by the U.S. Air Force for aerospace applications, POSS® originally cost as much as $5,000 per pound and took up to three years to produce. In Hybrid Plastics’ three-year ATP project (active from 1998-2001), the company simplified and redesigned the process chemistry. This reduced production costs 100-fold to about $50 per pound. The small start-up company began making the materials commercially in 1998, and now has more than 250 customers.

Current applications of POSS® include dental adhesives, in which a strengthened resin provides a strong interface between teeth and restorative material, and resins with reduced flammability for use in composite structures on naval ships. In addition, tests have shown that POSS® materials are much more resistant to radiation damage and erosion than conventional polymers used in space vehicles and platforms.

To learn more about the ATP, go to www.atp.nist.gov. For more information on Hybrid Plastics™ and POSS®, go to www.hybridplastics.com.

Media Contact:
Michael E. Newman, (301) 975-3025

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Quality

Learn from First Baldrige Health Care Recipient at March Conference

The upcoming Quest for Excellence XV conference will be the first opportunity to learn about the exceptional practices and results of the 2002 recipients of the Malcolm Baldrige National Quality Award, including the first winner in the health care category, SSM Health Care of St. Louis, Mo. The other two awardees are Motorola Inc. Commercial, Government, and Industrial Solutions Sector of Schaumburg, Ill. (manufacturing category) and Branch-Smith Printing Division of Fort Worth, Texas (small business category).

During the three-day conference (Mar. 30-Apr. 2, 2003), senior leaders and others from each of the three 2002 Baldrige Award recipients will give presentations and answer questions about their best practices and lessons learned on their journey to performance excellence. A free, pre-conference workshop will provide information about the Baldrige criteria for performance excellence and help attendees begin a self-assessment process using the criteria.

The conference is being held at the Marriott Wardman Park Hotel in Washington, D.C. The advance registration fee, due by March 2, is $995. The fee after March 2 is $1,145. A discounted fee for education faculty is $650 (advance) and $800 (regular). For further information, call (301) 975-2036 or visit the Baldrige National Quality Program Web site at www.quality.nist.gov.

Media Contact:
Jan Kosko, (301) 975-2767

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Health

NIST, UW Research May Lead to New Breast Cancer Detection Methods

Other than skin cancer, breast cancer is the most common type of cancer among women in the United States. More than 180,000 women are diagnosed with breast cancer each year.

Research has led to progress against breast cancer—better treatments, a lower chance of death from the disease and improved quality of life. Diagnosis, however, has not changed for years, relying on traditional physical exams and mammograms. Now, a research project being conducted by the National Institute of Standards and Technology (NIST) Electronics and Electrical Engineering Laboratory and the University of Wisconsin-Madison is developing the technology necessary for making probes that may lead to more accurate methods for detecting and diagnosing breast tumors.

The electric and magnetic properties that comprise healthy human breast tissue are affected by conditions that include age, body fat and a woman’s cycle. Considering this complex base of information, the NIST and UW-Madison researchers determined the characteristics for coaxial probes that can be used to measure these properties accurately.

The probes consist of flangeless, open-ended coaxial lines that are operational over a frequency range from 1 to 25 gigahertz. The development of this technology is an important first step toward the future use of probes to discern between the properties of healthy tissue and malignancies.

For more information on the research, contact Christopher L. Holloway, (303) 497-6184, holloway@boulder.nist.gov.

Media Contact:
Fred McGehan Boulder, (303) 497-7000

 

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Manufacturing

March Forum to Address Key Issues for Manufacturing Community

A plethora of important issues confronting the manufacturing community will be addressed at an upcoming national forum organized by the National Academies and sponsored by the National Institute of Standards and Technology (NIST). The event, “New Directions in Manufacturing,” will be held March 27-28, 2003, at the National Academy of Sciences in Washington, DC

Among the topics to be discussed:

  • Why is it important for the nation to care about manufacturing?
  • How does manufacturing impact society as the US economy becomes more service oriented?
  • What are the economic, societal and quality-of-life implications of US manufacturing jobs moving overseas?
  • Will information technology, nanotechnology, lean manufacturing or other recent innovations dramatically improve US manufacturers’ bottom line?
  • What is the role of manufacturing in national and homeland security?

The forum is intended to reinforce the importance of manufacturing to the US economy and national security, and to convey excitement about modern manufacturing technologies to policy makers and leaders. Forum participants will include executives and researchers in diverse sectors of the economy, users of manufactured products, government policy makers and investors.

The agenda, which is still being developed, will include sessions on the importance of manufacturing, economic perspectives, globalization and international issues, the impact of the information revolution, and challenges and opportunities in new technologies.

Information about forum registration and updates to the agenda can be found at www.nationalacademies.org/bmaed. Click on “New Directions in Manufacturing.”

Media Contact:
Laura Ost, (301) 975-4034

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Semiconductors

March Conference to Address Challenges to Chipmakers

Leading researchers from around the world will gather at the University of Texas in Austin when the National Institute of Standards and Technology (NIST) co-sponsors an international conference on the technical challenges confronting the semiconductor industry.

The five-day conference (March 24-28, 2003), Characterization and Metrology for ULSI technology, will include sessions on metrology breakthroughs expected to help shape the future of the semiconductor industry. Among the research topics to be covered are: innovative manufacturing techniques, recent developments in lithography, novel diagnostic approaches, and advances in computer modeling and simulation.

Co-sponsoring the conference with NIST are the University of Texas at Austin, the National Science Foundation, International SEMATECH, the American Physical Society, the Materials Research Society, the Electrochemical Society, the American Vacuum Society and the Semiconductor Research Corp.

Advance registration for the conference is open until March 7, 2003. More information, including a complete agenda and electronic registration form, may be accessed at www.eeel.nist.gov/812/conference.

Media Contact:
Philip Bulman, (301) 975-5661

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Buildings

Team with NIST’s Phan: Pentagon Structure Limited 9-11 Damage

Analysis by a team of six of the nation’s prominent structural, fire protection and forensic engineers—including National Institute of Standards and Technology (NIST) research structural researcher Long Phan—concluded that the 60-year-old Pentagon in Washington, DC, possessed a resilient structural system that curtailed the damage done by the intentional crash of a hijacked plane on Sept. 11, 2001.

Released on Jan. 23, 2003, by the American Society of Civil Engineers (ASCE), The Pentagon Building Performance Report showed that following the 9-11 crash, the structural system redistributed the weight of the building and its contents among the columns left standing, thereby limiting the collapse of floors above the point of impact.

The team concluded that the Pentagon’s structural performance validates measures to reduce collapse resulting from unlikely events. These measures include continuity, redundancy in design and construction, and spirally steel-reinforced concrete columns that absorb energy from a lateral load.

To order a copy of The Pentagon Building Performance Report, go to www.asce.org.

Media Contact:
Michael E. Newman, (301) 975-3025

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Solar Research

Satellite Measures Sun’s True Power with NIST Help

Photo by NASA, solar flare
NIST-calibrated instruments aboard a new satellite launched by NASA should help scientists gain important information about the sun's effect on the Earth's atmosphere and climate.

Scientists expect to gain important information about the sun’s effect on the Earth’s atmosphere and climate from sophisticated instruments—all calibrated by NIST or relying on components measured by NIST—successfully launched on a satellite Jan. 25, 2003.

The Solar Radiation and Climate Experiment (SORCE) has a five-year assignment to provide precise and accurate daily measurements of the sun’s radiant power (or light intensity). The satellite will collect data on both total light output and amount of optical radiation at particular wavelengths in the ultraviolet (UV) to near-infrared parts of the electromagnetic spectrum.

Two NIST-calibrated instruments will take spectral readings of the UV intensity. NIST also calibrated an assortment of small photodiodes for another instrument that will measure extreme ultraviolet radiation (EUV) and low-energy X-rays. For additional instruments, NIST performed accurate measurements of the areas of optical apertures, which are used to define the conditions for various solar irradiance measurements.

The calibrations were performed at NIST’s Synchrotron Ultraviolet Radiation Facility (SURF III), which offers specialized beamlines with unique
calibration equipment and a highly accurate radiometric standard.

More information about the mission can be found at http://lasp.colorado.edu/sorce/index.html.

Media Contact:
Laura Ost, (301) 975-4034

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Editor: Michael E. Newman

Date created: 1/28/2003
Contact: inquiries@nist.gov